Analytics - Bringing the hidden to light

Analytics - bringing the hidden to light

As an leading OEM supplier in the field of analytics we provide international OEM customers with optical components and demanding assemblies and systems, which make a vital contribution to the detailed examination of solid, liquid and gaseous materials. For example:

• Complex objectives
• Plano, concave and convex holographic gratings with high line density

In order to fulfill state-of-the-art requirements and convince through unique quality, many of our systems are manufactured and mounted in clean rooms.

System engineering	Optical and mechanical design
Coating design	Customer-specific metrology

Material: optical glass, CaF2, MgF2, quartz, glassceramics, ceramic, borosilicate glass und filter glass

 Spherical lenses

Dimensions	up to Ø 500 mm
Radii	1.2 mm upwards (without limit)
Centering error	10"
Fitting error	λ/40 PV, measured at 632.8 nm
Surface error	5/1 x 0.025
Micro roughness	2 Å rms
Average thickness tolerance	+/- 3 µm
Diameter tolerance	+/- 3 µm

 Aspherical lenses

Dimensions	Ø 5 - 150 mm
Fitting error	λ/20 PV, convex und concave, direct interferometric measurement

 Cylindrical lenses

Radii	2 - 50,000 mm
Length	up to 500 mm, larger on request
Lens width	up to 300 mm (depending on the focal length)
Fitting error	λ/8 PV, measured at 632.8 nm
Surface error	5/1 x 0.025
Micro roughness	2 Å rms
Centering	Rotation: 10", offset: 4 µm, wedge: 3µm

Plano optics

 Windows, prisms and prism systems

Dimensions	up to max. 1,500 mm
Flatness	λ/40 PV, measured at 632.8 nm
Parallelism	1"
Angular accuracy	1"
Micr roughness	2 Å rms
Surface defects	5/1 x 0.004

Microstructuring

• Reticules, masks, coded and analog circles
• Structured coatings
  

Coating

Coating design

Spectral range: VUV, DUV, UV, VIS,      NIR, IR correspondingly approx. 130 - 6.000 nm

Anti-reflex coatings

Broadband

V-coatings

W-coatings

Filters

Edge filter	Band-pass filter
Gradient filter (neutral density filter)

Mirrors

Metallic mirrors	Dielectric mirrors
Laser mirrors with high damage threshold

Beam splitter/combiner (cemented/uncemented)

Polarising (polarisers)

Non-polarising

Color splitter

ITO coating

Holographic gratings

• Optical assemblies and systems (cemented beam splitter, prim systems, doublets, triplets, step systems)
• Optomechanical assemblies and systems
• Elektro-optical systems
• Lens systems
• Objectives, zoom systems
• Measuring systems
• Cameras
• Laser systems
• Light sources
• Lighting systems
  

Wavefront	Interferometer (4 - 24"), Shack-Hartmann wavefront sensor (UV, DUV, VIS, NIR)
Form deviation	3D coordinate measuring devices, calliper, CCD micrometers, Stitching interferometer
Angle precision	Goniometer, interferometer, autocollimators
Transmission/reflection	Spektral photometer
Surface defects	Traveling microscopes
Micro roughness	White light interferometer, atomic force microscope
Imaging performance/resolution	Computer-supported MTF-measurement, microscopic image resolution
Centering	Objective metrology system, laser centering station
Additional functional measurement	Assembly-specific metrology station
Fine correcting procedure	Ionic beam process, robotic polishing, magnetorheological process

^{*The following error and tolerance data indicates possible limit values. Specified and
assessed according to ISO/MIL/DIN.}